• DocumentCode
    2744179
  • Title

    Wide bandgap collectors in GaInP/GaAs heterojunction bipolar transistors with increased breakdown voltage

  • Author

    Flitcroft, R.M. ; Lye, B.C. ; Yow, E.K. ; Houston, P.A. ; Button, C.C. ; David, J.P.R.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Sheffield Univ., UK
  • fYear
    1997
  • fDate
    8-11 Sep 1997
  • Firstpage
    435
  • Lastpage
    438
  • Abstract
    Al0.11Ga0.89As in the base, adjacent to the collector has been used to eliminate the conduction band spike and demonstrate double HBTs with high breakdown voltages, BVCEO and BVBCO, of 44 V (current gain of 20) and 54 V respectively with a 1 μm thick GaInP collector doped to 2×1016cm -3 without any voltage dependence on the gain. The inferred electron lifetime in the AlGaAs base was found to be approximately ten times smaller than the equivalently doped GaAs. Analysis of the Kirk effect yielded an estimate of the effective velocity in the GaInP collector of 4.3×106 cms-1 at room temperature. A graded AlGaAs base and graded transition from GaInP at the base/collector junction to AlInP demonstrated a record breakdown voltage, BVBCO=74 V, for the same collector doping and thickness. Electron impact ionisation coefficients were measured for use in an Ebers-Moll model to predict breakdown voltage
  • Keywords
    III-V semiconductors; carrier lifetime; gallium arsenide; gallium compounds; heterojunction bipolar transistors; impact ionisation; indium compounds; power bipolar transistors; semiconductor device breakdown; wide band gap semiconductors; 44 to 74 V; Al0.11Ga0.89As; Ebers-Moll model; GaInP-GaAs; GaInP/GaAs heterojunction bipolar transistor; Kirk effect; breakdown voltage; conduction band spike; current gain; double HBT; effective velocity; electron impact ionisation coefficient; electron lifetime; wide bandgap collector; Breakdown voltage; Collision mitigation; Doping; Electrons; Gallium arsenide; Heterojunctions; Kirk field collapse effect; Photonic band gap; Temperature; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductors, 1997 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7503-0556-8
  • Type

    conf

  • DOI
    10.1109/ISCS.1998.711685
  • Filename
    711685