DocumentCode
2744179
Title
Wide bandgap collectors in GaInP/GaAs heterojunction bipolar transistors with increased breakdown voltage
Author
Flitcroft, R.M. ; Lye, B.C. ; Yow, E.K. ; Houston, P.A. ; Button, C.C. ; David, J.P.R.
Author_Institution
Dept. of Electron. & Electr. Eng., Sheffield Univ., UK
fYear
1997
fDate
8-11 Sep 1997
Firstpage
435
Lastpage
438
Abstract
Al0.11Ga0.89As in the base, adjacent to the collector has been used to eliminate the conduction band spike and demonstrate double HBTs with high breakdown voltages, BVCEO and BVBCO, of 44 V (current gain of 20) and 54 V respectively with a 1 μm thick GaInP collector doped to 2×1016cm -3 without any voltage dependence on the gain. The inferred electron lifetime in the AlGaAs base was found to be approximately ten times smaller than the equivalently doped GaAs. Analysis of the Kirk effect yielded an estimate of the effective velocity in the GaInP collector of 4.3×106 cms-1 at room temperature. A graded AlGaAs base and graded transition from GaInP at the base/collector junction to AlInP demonstrated a record breakdown voltage, BVBCO=74 V, for the same collector doping and thickness. Electron impact ionisation coefficients were measured for use in an Ebers-Moll model to predict breakdown voltage
Keywords
III-V semiconductors; carrier lifetime; gallium arsenide; gallium compounds; heterojunction bipolar transistors; impact ionisation; indium compounds; power bipolar transistors; semiconductor device breakdown; wide band gap semiconductors; 44 to 74 V; Al0.11Ga0.89As; Ebers-Moll model; GaInP-GaAs; GaInP/GaAs heterojunction bipolar transistor; Kirk effect; breakdown voltage; conduction band spike; current gain; double HBT; effective velocity; electron impact ionisation coefficient; electron lifetime; wide bandgap collector; Breakdown voltage; Collision mitigation; Doping; Electrons; Gallium arsenide; Heterojunctions; Kirk field collapse effect; Photonic band gap; Temperature; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Compound Semiconductors, 1997 IEEE International Symposium on
Conference_Location
San Diego, CA
Print_ISBN
0-7503-0556-8
Type
conf
DOI
10.1109/ISCS.1998.711685
Filename
711685
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