DocumentCode :
2744402
Title :
A method for the complex residual errors of a VNA in one-port measurements
Author :
Kim, Jeong-Hwan ; Kang, Jin-Seob ; Kwon, Jae-Yong ; Kim, Dae-Chan
Author_Institution :
Center for Electromagn. Wave, Korea Res. Inst. of Stand. & Sci. (KRISS), Daejeon, South Korea
fYear :
2012
fDate :
1-6 July 2012
Firstpage :
112
Lastpage :
113
Abstract :
This paper shows that a method using multiple air lines for estimating the complex residual errors of a VNA (Vector Network Analyzer) being calibrated by an `OSL´ (Open-Short-Load) technique, which is widely used for one-port measurements, can be applied to the case when an adapter should be used for the connection of air lines and calibration standards. It uses a simple circle fit algorithm, together with some techniques to be used for improving the accuracy in finding the center and radius of a circle in the complex reflection coefficient plane from measured calibration data.
Keywords :
calibration; measurement systems; network analysers; OSL technique; VNA; calibration standard; circle fit algorithm; complex reflection coefficient plane; complex residual error estimation; multiple air lines; one-port measurement; open-short-load technique; vector network analyzer; Accuracy; Atmospheric modeling; Calibration; Measurement uncertainty; Reflection; Standards; Vectors; ‘OSL’ technique; Vector network analyzer; air lines; calibration; circle fit; reflection coefficient measurements; residual errors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
ISSN :
0589-1485
Print_ISBN :
978-1-4673-0439-9
Type :
conf
DOI :
10.1109/CPEM.2012.6250686
Filename :
6250686
Link To Document :
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