Improvement of non-resonant perturbation measurement using S-matrix data

Author

Soukhov, N.V. ; Sun-Shin Jung ; Gun-Sik Park

Author_Institution

Vacuum Electrophys. Lab., Seoul Nat. Univ., South Korea

fYear

2000

fDate

12-15 Sept. 2000

Firstpage

335

Lastpage

336

Abstract

We report on the possibility of improving the phase measurements for the non-resonant perturbation techniques for estimating of the characteristic or interaction impedance in waveguides and slow wave structures. The measurement of the characteristic or interaction impedance is usually based on the nonresonant perturbation theory, which relates a normalized electromagnetic field strength with a small variations of the propagation constant between the perturbed and unperturbed circuit.

Keywords

S-matrix theory; S-parameters; electric impedance measurement; microwave measurement; perturbation techniques; phase measurement; slow wave structures; waveguides; 8 to 15 GHz; S-matrix data; characteristic impedance; interaction impedance; non-resonant perturbation measurement; nonresonant perturbation theory; normalized electromagnetic field strength; perturbed circuit; phase measurements; propagation constant variation; slow wave structures; unperturbed circuit; waveguides; Books; Circuits; Cutoff frequency; Electromagnetic measurements; Electromagnetic waveguides; Frequency measurement; Impedance measurement; Phase measurement; Scattering parameters; Transmission line matrix methods;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves, 2000. Conference Digest. 2000 25th International Conference on

Conference_Location

Beijing, China

Print_ISBN

0-7803-6513-5

Type

conf

DOI

10.1109/ICIMW.2000.893053

Filename

893053