Title :
BIST-based diagnostics of FPGA logic blocks
Author :
Stroud, Charles ; Lee, Eric ; Abramovici, Miron
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Abstract :
Accurate diagnosis is an essential requirement in many testing environments, since it is the basis for any repair or replacement strategy used for chip or system fault-tolerance. In this paper we present the first approach able to diagnose faulty programmable logic blocks (PLBs) in Field Programmable Gate Arrays (FPGAs) with maximal diagnostic resolution. Our approach is based on a new Built-In Self-Test (BIST) architecture for FPGAs and can accurately locate any single and most multiple faulty PLBs. An adaptive diagnostic strategy provides identification of faulty PLBs with a 7% increase in testing time over the complete detection test, and can also be used for manufacturing yield enhancement. We present results showing identification of faulty PLBs in defective ORCA chips
Keywords :
built-in self test; fault diagnosis; field programmable gate arrays; integrated circuit testing; integrated circuit yield; logic testing; BIST architecture; BIST-based diagnostics; FPGA logic blocks; ORCA chips; adaptive diagnostic strategy; detection test; diagnostic resolution; faulty programmable logic blocks; manufacturing yield enhancement; multiple faulty PLBs; replacement strategy; single faulty PLBs; system fault-tolerance; testing environments; testing time; Built-in self-test; Circuit faults; Circuit testing; Fault diagnosis; Field programmable gate arrays; Logic devices; Logic testing; Manufacturing; Programmable logic arrays; System testing;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639662
