Title :
Four-terminal mutual inductor for calibration of the lock-in amplifier at mV ranges
Author :
Pan, Xianlin ; Zhang, Jiangtao ; Zhu, Zhongwen ; Lin, Ting ; Wang, Biao
Author_Institution :
Harbin Inst. of Technol., Harbin, China
Abstract :
This paper describes a method for calibrating the accuracy and linearity in quadrature part of the lock-in amplifier at mV ranges. The method is based on the use of the four-terminal mutual inductor and three-branch binary inductive current divider (BICD). The measurement standard uncertainties are presented at frequencies from 20 kHz to 200 kHz.
Keywords :
amplifiers; calibration; dividing circuits; inductors; measurement standards; measurement uncertainty; calibration; four-terminal mutual inductor; frequency 20 kHz to 200 kHz; lock-in amplifier; measurement standard uncertainty; three-branch BICD; three-branch binary inductive current divider; Amplifiers; Current measurement; Frequency measurement; Inductance; Inductors; Shunt (electrical); Voltage measurement; Four-terminal mutual inductor; binary inductive current divider; binary inductive voltage divider; current-voltage method;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6251038
