Title :
Distribution-graph based approach and extended tree growing technique in power-constrained block-test scheduling
Author :
Murescan, V. ; Xiaojun Wang ; Murescan, V. ; Vladutiu, Mircea
Author_Institution :
Dublin City Univ., Ireland
Abstract :
A distribution-graph based scheduling algorithm is proposed together with an extended tree growing technique to deal with the problem of unequal-length block-test scheduling under power dissipation constraints. The extended tree growing technique is used in combination with the classical scheduling approach in order to improve the test concurrency having assigned power dissipation limits. Its goal is to achieve a balanced test power dissipation by employing a least mean square error function. The least mean square error function is a distribution-graph based global priority function. Test scheduling examples and experiments highlight in the end the efficiency of this approach towards a system-level test scheduling algorithm
Keywords :
VLSI; automatic test pattern generation; fault diagnosis; high level synthesis; integrated circuit testing; least mean squares methods; logic testing; scheduling; trees (mathematics); assigned power dissipation limits; balanced test power dissipation; distribution-graph based approach; extended tree growing technique; global priority function; least mean square error function; power dissipation constraints; power-constrained block-test scheduling; system-level test scheduling algorithm; test concurrency; unequal-length block-test scheduling; Circuit testing; Clocks; Concurrent computing; Design methodology; Mean square error methods; Performance evaluation; Power dissipation; Scheduling algorithm; System testing; Very large scale integration;
Conference_Titel :
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Conference_Location :
Taipei
Print_ISBN :
0-7695-0887-1
DOI :
10.1109/ATS.2000.893668
