Title :
Sub-nano resolution static strain fiber sensor using a novel sideband interrogation technique
Author :
Liu, Qingwen ; He, Zuyuan ; Tokunaga, Tomochika ; Hotate, Kazuo
Author_Institution :
Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
Abstract :
A novel sideband interrogation technique was proposed to measure the resonance difference between two Fabry-Perot interferometers. With this technique sub-nano static strain-resolution was demonstrated experimentally for the first time to the best of our knowledge.
Keywords :
Fabry-Perot interferometers; fibre optic sensors; strain sensors; Fabry-Perot interferometers; resonance difference; sideband interrogation technique; sub-nano resolution static strain fiber sensor; sub-nano static strain-resolution; Amplitude modulation; Fiber lasers; Geophysical measurements; Measurement by laser beam; Optical fiber sensors; RF signals; Strain;
Conference_Titel :
Photonics Conference (PHO), 2011 IEEE
Conference_Location :
Arlington, VA
Print_ISBN :
978-1-4244-8940-4
DOI :
10.1109/PHO.2011.6110863
