Title :
A Practical Approach to Threshold Test Generation for Error Tolerant Circuits
Author :
Ichihara, Hideyuki ; Sutoh, K. ; Yoshikawa, Yuki ; Inoue, Tomoo
Author_Institution :
Grad. Sch. of Inf. Sci., Hiroshima City Univ., Hiroshima, Japan
Abstract :
Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this paper, we propose test generation models for threshold test generation. Using the proposed models, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show that our approach is practically effective.
Keywords :
automatic test pattern generation; fault diagnosis; large scale integration; tolerance analysis; LSI testing method; error tolerant circuits; fault acceptability; selective hardening; threshold test generation; yield enhancement; Automatic test pattern generation; Circuit faults; Circuit testing; Error analysis; Fault diagnosis; Large scale integration; Life estimation; Logic testing; System testing; Test pattern generators; acceptable fault; error significance; error tolerance; test generation model; threshold testing;
Conference_Titel :
Asian Test Symposium, 2009. ATS '09.
Conference_Location :
Taichung
Print_ISBN :
978-0-7695-3864-8
DOI :
10.1109/ATS.2009.19