• DocumentCode
    2755282
  • Title

    Using Non-trivial Logic Implications for Trace Buffer-Based Silicon Debug

  • Author

    Prabhakar, Sandesh ; Hsiao, Michael

  • Author_Institution
    Electr. & Comput. Eng. Virginia Tech, Blacksburg, VA, USA
  • fYear
    2009
  • fDate
    23-26 Nov. 2009
  • Firstpage
    131
  • Lastpage
    136
  • Abstract
    An effective silicon debug technique uses a trace buffer to monitor and capture a portion of the circuit response during its functional, post-silicon operation. Due to the limited space of the available trace buffer, selection of the critical trace signals plays an important role in both minimizing the number of signals traced and maximizing the observability/restorability of other untraced signals during post-silicon validation. This paper presents a new method for trace buffer signal selection for the purpose of post-silicon debug. The selection is performed by favoring those signals with the most number of implications that are not implied by other signals. Then, based on the values of the traced signals during silicon debug, we introduce an algorithm which uses a SAT-based multi-node implication engine to restore the values of untraced signals across multiple time-frames. Experimental results for sequential benchmark circuits showed that the proposed approach selects the trace signals effectively, giving a high restoration percentage compared with other techniques.
  • Keywords
    integrated circuit testing; logic testing; SAT-based multinode implication engine; critical trace signals; multiple time-frames; nontrivial logic implications; post-silicon operation; restoration percentage; sequential benchmark circuits; trace buffer signal selection; trace buffer-based silicon debug; Circuit testing; Computer bugs; Computerized monitoring; Logic circuits; Logic gates; Logic testing; Manufacturing; Signal analysis; Signal restoration; Silicon; Forward Learning; Logic implication; Silicon debug; State Restoration; Trace-signal selection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2009. ATS '09.
  • Conference_Location
    Taichung
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-3864-8
  • Type

    conf

  • DOI
    10.1109/ATS.2009.20
  • Filename
    5359383