Title :
A physical design tool for built-in self-repairable static RAMs
Author :
Chakraborty, Kanad ; Gupta, Anurag ; Bhattacharya, Mayukh ; Kulkarni, Shriram ; Mazumder, Pinaki
Author_Institution :
IBM Corp., East Fishkill, NY, USA
Abstract :
A novel physical design tool, BISRAMGEN, that generates layout geometries of parametrized built-in self-repairable SRAM modules, producing significant improvement in testability, reliability, production yield and manufacturing cost of ASICs and microprocessors with embedded RAMs, is presented.
Keywords :
SRAM chips; built-in self test; circuit layout CAD; design for testability; integrated circuit reliability; integrated circuit yield; BISRAMGEN; built-in self-repairable static RAMs; embedded RAMs; layout geometries; manufacturing cost; parametrized modules; physical design tool; production yield; reliability; testability; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Design automation; Geometry; Production; Random access memory; Very large scale integration;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
Conference_Location :
Munich, Germany
Print_ISBN :
0-7695-0078-1
DOI :
10.1109/DATE.1999.761208
