Title :
Cu internal electrode multilayer ceramic capacitor
Author :
Hakotani, Yasuhiko ; Nakatani, Seiichi ; Yuhaku, Satoru ; Nishimura, Tsutomu ; Ishida, Toru
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
Abstract :
The authors have developed a process for the manufacture of a multilayer ceramic capacitor with copper internal electrodes (CuMLC). The method employs low-firing-temperature Pb(Mg1/3Nb2/3 )Cu0.01O3.01 and copper oxide paste as dielectric and conductive materials, respectively. The organic binder is burned out in air, and this step is followed by reduction of copper oxide and sintering. The following electrical properties of CuMLC were obtained: dielectric constant: 11000; dissipation factor at 1 kHZ, 1 Vrms 0.5%; insulation resistance: >10000 ΩF (at 25°C). In the load humidity test (85°C, 85% RH, 50 V), no degradation of insulation resistance was found during 1000 h of testing
Keywords :
capacitors; permittivity; sintering; CuO; PbCuMgO3NbO3; conductive materials; dielectric constant; dissipation factor; electrical properties; firing temperature; insulation resistance; load humidity test; multilayer ceramic capacitor; organic binder; sintering; Capacitors; Ceramics; Copper; Dielectrics and electrical insulation; Electric resistance; Electrodes; Insulation testing; Manufacturing processes; Niobium; Nonhomogeneous media;
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International
Conference_Location :
Nara
DOI :
10.1109/IEMTS.1989.76127
