Title :
Detectability analysis for resistive open faults with dynamic supply voltage scaling awareness
Author :
Mohammadat, Mohamed Tag Eisir ; Ali, Noohul Basheer Zain ; Hussin, Fawnizu Azmadi
Author_Institution :
Electr. & Electron. Eng. Dept., Univ. Teknol. Petronas, Tronoh, Malaysia
Abstract :
Dynamic supply voltage scaling (DVS) is an efficient and practical design technique to reduce power consumption in VLSI devices. Due to the multiple voltage operating environment and the supply voltage dependent behavior of physical faults, obtaining a minimal test set which gives the best fault coverage is challenging. Researchers have showed that testing of resistive opens is best achieved at high supply voltage. However based on our experimental results on ISCAS-85 circuits it is shown that is not always the case for DVS enabled designs. This paper analyzes and identifies different detectability patterns for resistive open faults in such designs. Additionally it discussed the multi-VDD testing and its necessity to achieve 100% fault coverage.
Keywords :
VLSI; fault diagnosis; integrated circuit design; integrated circuit reliability; integrated circuit testing; DVS enabled designs; ISCAS-85 circuits; VLSI devices; detectability pattern analysis; dynamic supply voltage scaling awareness; minimal test set; multiVDD testing; multiple voltage operating environment; physical faults; power consumption reduction; resistive open fault testing; supply voltage dependent behavior; Delay; Testing; Delay Fault Testing; Dynamic Voltage Scaling; Multi Voltage Testing; Resistive Open Faults;
Conference_Titel :
Quality Electronic Design (ASQED), 2011 3rd Asia Symposium on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4577-0145-0
DOI :
10.1109/ASQED.2011.6111742