DocumentCode
2760397
Title
Texture classification using wavelet transform and support vector machines
Author
Sidhu, Samsher ; Raahemifar, Kaamran
Author_Institution
Dept. of Electr. & Comput. Eng., Ryerson Univ., Toronto, Ont.
fYear
2005
fDate
1-4 May 2005
Firstpage
941
Lastpage
944
Abstract
In this paper, we have investigated an approach based on support vector machines (SVMs) and wavelet transform (WT) for texture analysis. Texture analysis plays an important role in many tasks, ranging from remote sensing to medical imaging and query by content in large image databases. The main difficulty of texture analysis in the past was the lack of adequate tools to characterize different scales of texture effectively. The development in multi-resolution analysis such as wavelet transform has helped overcome this difficulty. It was found that the results using the combination of wavelet statistical and wavelet co-occurrence features generated from discrete wavelet transform for texture classification are promising. In recent years, support vector machines (SVM) have demonstrated excellent performance in a variety of pattern recognition problems. By applying SVM in tandem with the discrete wavelet transform for texture classification, it has produced more accurate classification results based on the Brodatz texture database
Keywords
discrete wavelet transforms; image classification; image resolution; image texture; statistical analysis; support vector machines; visual databases; Brodatz texture database; SVM; discrete wavelet transform; image databases; medical imaging; multiresolution analysis; pattern recognition problems; remote sensing; support vector machines; texture analysis; texture classification; wavelet cooccurrence features; wavelet transform; Biomedical imaging; Discrete wavelet transforms; Image analysis; Image databases; Image texture analysis; Remote sensing; Support vector machine classification; Support vector machines; Wavelet analysis; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering, 2005. Canadian Conference on
Conference_Location
Saskatoon, Sask.
ISSN
0840-7789
Print_ISBN
0-7803-8885-2
Type
conf
DOI
10.1109/CCECE.2005.1557131
Filename
1557131
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