• DocumentCode
    2760397
  • Title

    Texture classification using wavelet transform and support vector machines

  • Author

    Sidhu, Samsher ; Raahemifar, Kaamran

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ryerson Univ., Toronto, Ont.
  • fYear
    2005
  • fDate
    1-4 May 2005
  • Firstpage
    941
  • Lastpage
    944
  • Abstract
    In this paper, we have investigated an approach based on support vector machines (SVMs) and wavelet transform (WT) for texture analysis. Texture analysis plays an important role in many tasks, ranging from remote sensing to medical imaging and query by content in large image databases. The main difficulty of texture analysis in the past was the lack of adequate tools to characterize different scales of texture effectively. The development in multi-resolution analysis such as wavelet transform has helped overcome this difficulty. It was found that the results using the combination of wavelet statistical and wavelet co-occurrence features generated from discrete wavelet transform for texture classification are promising. In recent years, support vector machines (SVM) have demonstrated excellent performance in a variety of pattern recognition problems. By applying SVM in tandem with the discrete wavelet transform for texture classification, it has produced more accurate classification results based on the Brodatz texture database
  • Keywords
    discrete wavelet transforms; image classification; image resolution; image texture; statistical analysis; support vector machines; visual databases; Brodatz texture database; SVM; discrete wavelet transform; image databases; medical imaging; multiresolution analysis; pattern recognition problems; remote sensing; support vector machines; texture analysis; texture classification; wavelet cooccurrence features; wavelet transform; Biomedical imaging; Discrete wavelet transforms; Image analysis; Image databases; Image texture analysis; Remote sensing; Support vector machine classification; Support vector machines; Wavelet analysis; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2005. Canadian Conference on
  • Conference_Location
    Saskatoon, Sask.
  • ISSN
    0840-7789
  • Print_ISBN
    0-7803-8885-2
  • Type

    conf

  • DOI
    10.1109/CCECE.2005.1557131
  • Filename
    1557131