Title :
An ultrasonic micro-spectrometer for the evaluation of elastic properties with microscopic resolution
Author :
Tsukahara, Yusuke ; Ohira, Katsumi ; Nakaso, Noritaka
Author_Institution :
Toppan Printing Co. Ltd., Saitama, Japan
Abstract :
The authors describe a novel technique for the quantitative measurement of elastic properties, including the anisotropy, on a small surface area of a specimen. Specifically, an ultrasonic microspectrometer (UMSM) is introduced. In the UMSM, a pulsed ultrasonic wave with an oblique incidence is focused on the specimen surface by a spherical lens, and a plane wave component with a specific wave vector is extracted by a planar transducer from a reflected divergent wave. The Fourier spectrum of the received signal reveals the frequency dependence of the reflection coefficient of a small spot of the specimen surface. A prototype system operates in a frequency range from 20 to 150 MHz, and in the incidence angle range from 20° to 40°
Keywords :
elastic moduli measurement; ultrasonic materials testing; 20 to 150 MHz; Fourier spectrum; elastic properties; frequency dependence; frequency range; microscopic resolution; oblique incidence; planar transducer; plane wave component; pulsed ultrasonic wave; received signal; reflected divergent wave; reflection coefficient; small spot; specific wave vector; specimen surface; spherical lens; ultrasonic micro-spectrometer; Acoustic measurements; Anisotropic magnetoresistance; Lenses; Microscopy; Optical reflection; Prototypes; Surface acoustic waves; Surface waves; Ultrasonic variables measurement; Wavelength measurement;
Conference_Titel :
Ultrasonics Symposium, 1990. Proceedings., IEEE 1990
Conference_Location :
Honolulu, HI
DOI :
10.1109/ULTSYM.1990.171498