DocumentCode :
2761858
Title :
Profiling high-angle surfaces with focused transducers and time-of-flight measurements
Author :
Stanke, Fred E. ; Liang, Kenneth K.
Author_Institution :
Schlumberger-Doll Res., Ridgefield, CT, USA
fYear :
1990
fDate :
4-7 Dec 1990
Firstpage :
1053
Abstract :
The goal is to image the distance from the surface to the single transducer which scans over the surface with its axis aligned with the mean normal to the surface. A temporally compact pulse is dispersed by reflection from the surface. Consequently, the time of flight is ambiguous. The major practical goal in this case is to avoid cycle skipping, in order to achieve a profile that is at least accurate to somewhat less than a wavelength. It is demonstrated that focused transducers are better than flat transducers with comparable resolutions for profiling surfaces with high angles
Keywords :
surface topography measurement; ultrasonic materials testing; axis; cycle skipping; focused transducers; high-angle surfaces; reflection; temporally compact pulse; time-of-flight measurements; Computed tomography; Focusing; Frequency; Reflection; Rough surfaces; Scattering; Surface roughness; Threshold voltage; Time measurement; Ultrasonic transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1990. Proceedings., IEEE 1990
Conference_Location :
Honolulu, HI
Type :
conf
DOI :
10.1109/ULTSYM.1990.171523
Filename :
171523
Link To Document :
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