• DocumentCode
    2761985
  • Title

    Test and on-line debug capabilities of IEEE Std 1149.1 in UltraSPARCTM-III microprocessor

  • Author

    Golshan, Farideh

  • Author_Institution
    Processor Product Group, Sun Microsyst. Inc., Palto Alto, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    141
  • Lastpage
    150
  • Abstract
    The IEEE Std 1149.1 features have been essential in system and chip debug, test and manufacturing of UltraSPARC-III product. Several key testability features were achieved by adding a suite of customized instructions and logic to the chip core and I/Os to allow test and debug when in test mode or debug during normal operations. In addition, due to the design of high speed I/Os, extra logic was added to Boundary-Scan to maintain compliancy and provide support for all test and debug features. This paper discusses the above features and their logic implementations
  • Keywords
    IEEE standards; boundary scan testing; computer debugging; integrated circuit testing; logic testing; microprocessor chips; IEEE 1149 standard; UltraSPARC-III microprocessor; boundary scan testing; high-speed I/O; logic testing; on-line debugging; Bandwidth; Clocks; Logic design; Logic testing; Manufacturing processes; Microprocessors; Registers; Sun; System testing; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2000. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-6546-1
  • Type

    conf

  • DOI
    10.1109/TEST.2000.894201
  • Filename
    894201
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2761985