Title :
DECOUPLE: defect current detection in deep submicron IDDQ
Author_Institution :
Semicond. Co., Sony Corp., Japan
Abstract :
IDDQ test concept for deep submicron (DSM) devices named DECOUPLE (Defect Current Observation Under the Proportion of intrinsic Leakage currents) is proposed. A new clustering method obtained two defect free groups from a production data set by abstracting from a signature of intrinsic leakage current that is independent of process variations. Possible pass/fail tests, diagnosis, and detection of parametric defect currents are discussed on the data set. Another example of the pass/fail tests on a second product is presented
Keywords :
data analysis; electric current measurement; fault diagnosis; integrated circuit modelling; integrated circuit testing; leakage currents; production testing; DECOUPLE; clustering; deep submicron IDDQ; deep submicron devices; defect current detection; diagnosis; leakage currents; parametric defect currents; pass/fail tests; production data; signature; Circuit simulation; Circuit testing; Clustering methods; Costs; Current measurement; Leak detection; Leakage current; Production; Switches; Temperature;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894207
