Title :
A domain coverage metric for the validation of behavioral VHDL descriptions
Author :
Zhang, Qiushuang ; Harris, Ian G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
Abstract :
During functional validation, corner cases and boundary conditions are known to be difficult to verify. We propose a functional fault coverage metric for behavioral VHDL descriptions which evaluates the coverage of faults which cause the behavior to execute an incorrect functional domain. Although domain faults are known to be a source of design errors, they are not targeted explicitly by previous work in functional validation. We propose an efficient method to compute domain coverage in VHDL descriptions and we generate domain coverage results for several benchmark VHDL circuits for comparison to other approaches
Keywords :
fault simulation; hardware description languages; logic CAD; logic testing; program testing; program verification; VHDL description validation; behavioral VHDL descriptions; design errors; domain coverage metric; domain faults; functional fault coverage metric; functional validation; Benchmark testing; Circuit faults; Circuit simulation; Computational modeling; Fault detection; Hardware design languages; Manufacturing; Software testing; Switches; Test pattern generators;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894218