Title :
Coordinated electrical characterization system for photovoltaic devices
Author :
Li, Jian V. ; Tynan, Jerry ; Yuan, Hao-Chih ; Wang, Qi ; Albin, David S. ; Li, Xiaonan ; Levi, Dean H.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
Abstract :
We report the development of a coordinated electrical characterization station integrating the data collection and analysis of a wide variety of DC, AC, and transient measurements. The DC current-voltage measurements consider the overall carrier-transport characteristics and cell performance. The AC measurements (e.g., capacitance-voltage, admittance spectroscopy, drive-level capacitance profiling) provide information regarding the spatial distribution and exchange of charge carriers with traps. The transient measurements (e.g., open-circuit voltage decay) investigate the lifetime and recombination of non-equilibrium carriers in a cell. We demonstrate that a coordinated characterization including the DC, AC, and transient measurements may generate new insight and unique understanding of the photovoltaic device. Using the equivalent-circuit parameters determined from the coordinated characterization set, we simulated the decay behavior of the open-circuit voltage in a crystalline silicon solar cell and found good agreement with experiment. The coordinated electrical characterization of CdTe thin-film solar cells not only avoided a misinterpretation of the admittance spectroscopy data, but also provided information to estimate the electrically active thickness, photoconductivity, and mobility of the CdTe absorber.
Keywords :
II-VI semiconductors; cadmium compounds; photoconductivity; semiconductor thin films; solar cells; AC measurements; CdTe; CdTe thin-film solar cells; DC current-voltage measurements; carrier-transport characteristics; coordinated electrical characterization system; crystalline silicon solar cell; decay behavior; equivalent-circuit parameters; open-circuit voltage; photovoltaic devices; transient measurements;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-5890-5
DOI :
10.1109/PVSC.2010.5615863