Future of raman in PV development

We introduce and demonstrate two innovative macro-Raman mapping modes for advanced microstructural and mechanical characterization of photovoltaic (PV) materials. The macro- and micro- Raman results presented in this work are obtained on multicrystalline silicon (mc-Si) thin films on glass for solar cells. We show that detailed information can be extracted from the same first-order Raman spectra of solar silicon. This enables us to understand the interaction between stresses, defects, doping/impurities, and microstructure at identical positions as well as at different length scales. The fast and large-scale imaging Raman instrument allows us to evaluate statistically the materials properties and to see clearly the differences originating from different preparation conditions/processing. Based on these results, we believe that the Raman technique will become increasingly important in the PV community not only for fundamental studies but also for optimization and in-line quality check in a PV factory.