DocumentCode :
2762932
Title :
The propagation characteristics of double-layer substrate integrated waveguide (SIW) structure
Author :
Che, Wenquan ; Xu, Lei ; Geng, Liang ; Wang, Dapeng
Author_Institution :
Nanjing Univ. of Sci. & Technol., Nanjing
fYear :
2006
fDate :
12-15 Dec. 2006
Firstpage :
1392
Lastpage :
1394
Abstract :
The propagation characteristics of double-layer SIW structures have been investigated in this paper. Based on the theory of resonance cavity and SIW, the simple theoretical formulas for the lower and upper frequencies in the passband have been found. The theoretical analyses have indicated these two frequencies have much dependence on the width of SIW and the length of the coupling slot. Agreement between the simulation data and the calculated results from the formulas can be observed.
Keywords :
cavity resonators; electromagnetic wave propagation; rectangular waveguides; waveguide theory; coupling slot; double-layer SIW; propagation characteristics; resonance cavity theory; substrate integrated waveguide; Circuits; Frequency; Microwave propagation; Nonhomogeneous media; Passband; Planar waveguides; Rectangular waveguides; Resonance; Tellurium; Waveguide theory; Double layers; lower and upper frequencies; propagation characteristics; substrate integrated waveguide (SIW);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2006. APMC 2006. Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-4-902339-08-6
Electronic_ISBN :
978-4-902339-11-6
Type :
conf
DOI :
10.1109/APMC.2006.4429667
Filename :
4429667
Link To Document :
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