Title :
Streamlining programmable device and system test using IEEE Std 1532
Author :
Jacobson, Neil G.
Author_Institution :
Xilinx Inc., San Jose, CA, USA
Abstract :
The advent and recent approval of IEEE Std 1532 has provided the foundation for major improvements in both the quality and the manner in which programmable devices and systems can be tested. IEEE Std 1532 extends and enhances IEEE Std 1149.1 to fully describe and document the operation and external behavior of programmable logic devices. We discuss the manner in which turnkey configurability can be exploited in the test environment. In particular, we show how 1532 simplifies the programmable device testing process and how it both extends and enhances an IEEE Std 1149.1-based system test suite
Keywords :
IEEE standards; automatic testing; logic testing; programmable logic devices; BSDL; IEEE Std 1532; programmable device testing; programmable logic devices; quality; turnkey configurability; Access protocols; Circuit testing; Communication standards; Jacobian matrices; Logic devices; Logic testing; Programmable logic devices; Registers; System testing; USA Councils;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894290
