DocumentCode :
2764558
Title :
Room Temperature Steady-State and Transient Carrier Transport Properties of Germanium Single Electron/Hole Transistors
Author :
Lai, W.T. ; Li, Peter W. ; Kuo, D.M.T.
Author_Institution :
Dept. of Electr. Eng., National Central Univ., ChungLi
fYear :
2006
fDate :
15-17 May 2006
Firstpage :
1
Lastpage :
2
Abstract :
A single electron transistor (SET) is an ultimate scheme of electronic devices for the purpose of controlling current with one charge precision based on Coulomb blockade effect. A SET could be used as a highly sensitive electrometer and might provide great potential applications for quantum information technology. For RT operation, the size of a Si-based QD should be less than 10 nm to prevent errors caused by thermal fluctuation. Nevertheless, control of nanometer-scaled thickness, area, and volume is not easy even when state of the art lithography and/or self-organization techniques are used. The solution we propose to alleviate this problem is to form Ge QDs by selective oxidation of Si1-xGexSi-on-insulator (SOI) (Li et al., 2004). Using this method, Ge QDs are comparatively uniform and thermodynamically stable since Ge QDs are confined by the insulating layers. The proposed process is compatible to CMOS technology and can be easily adapted in the fabrication of embedded circuits
Keywords :
CMOS integrated circuits; Ge-Si alloys; carrier mobility; germanium; oxidation; semiconductor quantum dots; single electron transistors; CMOS technology; Coulomb blockade effect; Ge QD; Si-on-insulator; SiGe; carrier transport property; embedded circuits; single electron hole transistor; CMOS technology; Charge carrier processes; Computer errors; Fluctuations; Germanium; Information technology; Single electron transistors; Steady-state; Temperature sensors; Thickness control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SiGe Technology and Device Meeting, 2006. ISTDM 2006. Third International
Conference_Location :
Princeton, NJ
Print_ISBN :
1-4244-0461-4
Type :
conf
DOI :
10.1109/ISTDM.2006.246510
Filename :
1716004
Link To Document :
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