• DocumentCode
    2766232
  • Title

    On the bandgap of hydrogenated nanocrystalline silicon thin films

  • Author

    Yan, Baojie ; Yue, Guozhen ; Sivec, Laura ; Jiang, Chun-Sheng ; Yan, Yanfa ; Alberi, Kirstin ; Yang, Jeffrey ; Guha, Subhendu

  • Author_Institution
    United Solar Ovonic LLC, Troy, MI, USA
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    Hydrogenated nanocrystalline silicon (nc-Si:H) has attracted a great deal of attention in solar cell applications. However, the material properties have not been very well understood because of the complexity of the structure. The objective of this paper is to find the optical bandgap by measuring the absorption coefficients as a function of wavelength. We found that no good linearity was observed on the Tauc plot for nc-Si:H films. It means that one cannot obtain the optical bandgap of nc-Si:H from the Tauc plot. Instead, a plot of (αhv)1/5 versus hv shows a straight line for a wide range of photon energies. The intersection on the h?-axis is around 1.1 eV, which is coincidentally the same as the bandgap of c-Si. The simplest explanation of the 1/5 power could be a superposition of absorptions from nanocrystallites and amorphous tissues. We also measured the dark current versus voltage characteristics as a function of temperature for nc-Si:H solar cells. The pre-factor of the diode characteristics shows a thermal activation energy of 0.55-0.65 eV. If the Fermi level is at the middle of the bandgap, the mobility bandgap of nc-Si:H is around 1.1-1.3 eV.
  • Keywords
    absorption coefficients; hydrogen; nanostructured materials; narrow band gap semiconductors; photons; porous semiconductors; semiconductor thin films; silicon; solar cells; Si:H; Tauc plot; absorption coefficient; diode characteristic; hydrogenated nanocrystalline silicon thin film bandgap; mobility bandgap; optical bandgap; photon energy; solar cell application; thermal activation energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5616075
  • Filename
    5616075