• DocumentCode
    2768239
  • Title

    Evaluation of wheeler cap antenna efficiency measurement methods using numerical EM simulation data

  • Author

    Johnston, Ronald H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Calgary Univ., Calgary, AB
  • fYear
    2008
  • fDate
    5-11 July 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The paper presents the two port efficiency method produces loss numbers that are in the best agreement with the direct normalized loss simulation results. The series circuit model loss gives approximately correct numbers for the monopole antenna while the parallel circuit loss calculations are highly inaccurate. However, it is interesting to note that for other two antennas, the series circuit calculations are substantially inaccurate while the parallel circuit calculations are approximately correct. The monopole antenna shows a S11 trajectory on the Smith Chart that approximates a series resonant circuit as a function of frequency. The PIFA and microstrip patch antennas show an S11 trajectory that approximates that of a parallel resonant circuit. This author believes that the S11 trajectory as function of frequency is an important factor in deciding which equation to use, if one chooses not to use the most accurate of the three methods, the two port efficiency calculation method.
  • Keywords
    microstrip antennas; monopole antennas; numerical analysis; planar inverted-F antennas; PIFA; Smith Chart; direct normalized loss simulation results; microstrip patch antennas; monopole antenna; numerical EM simulation data; parallel circuit loss calculations; series circuit model; series resonant circuit; two port efficiency method; wheeler cap antenna efficiency measurement methods; Antenna measurements; Circuits; Computational modeling; Conductivity; Conductors; Copper; Dielectric losses; Numerical simulation; Optical wavelength conversion; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-2041-4
  • Electronic_ISBN
    978-1-4244-2042-1
  • Type

    conf

  • DOI
    10.1109/APS.2008.4619374
  • Filename
    4619374