Title :
Obtaining accurate confidence regions for the estimated zeros and poles in system identification problems
Author :
Vuerinckx, R. ; Pintelon, R. ; Schoukens, J. ; Rolain, Y.
Author_Institution :
Vrije Univ., Brussels, Belgium
Abstract :
System identification techniques allow to obtain actual numbers for the parameters of a device under test (DUT). However, of almost equal importance is to know how accurate these calculated values are. When modelling the DUT by a rotational function in the frequency domain, the covariance matrix of the coefficients can be approximated pretty well, and this matrix defines a confidence ellipsoid in the coefficient space in which the true coefficients must lie with a given probability. When calculating the zeros and the poles of this model, one would also like to know how precise these zeros and poles are; with possibly a graphical representation of their confidence region. However, until now the uncertainty of the zeros and poles was calculated by a linearization of the nonlinear transformation between the coefficients and the roots. It will be shown that this approach may significantly underestimate the uncertainty of the zero/pole estimates. An algorithm will be presented that calculates confidence regions which match very well the true uncertainty regions of the zero/pole estimates. Simulations are included to show its effectiveness
Keywords :
covariance matrices; frequency-domain analysis; identification; poles and zeros; probability; rational functions; testing; coefficient space; confidence ellipsoid; confidence regions; covariance matrix; device testing; estimated poles; estimated zeros; frequency domain; graphical representation; linearization; nonlinear transformation; probability; roots; rotational function; system identification problems; Covariance matrix; Ellipsoids; Frequency domain analysis; Frequency estimation; Noise measurement; Poles and zeros; Signal processing; System identification; System testing; Uncertainty;
Conference_Titel :
Decision and Control, 1998. Proceedings of the 37th IEEE Conference on
Conference_Location :
Tampa, FL
Print_ISBN :
0-7803-4394-8
DOI :
10.1109/CDC.1998.762018