• DocumentCode
    2769971
  • Title

    On error exponents of nested lattice codes for the AWGN channel

  • Author

    Liu, Tie ; Moulin, Pierre ; Koetter, Ralf

  • Author_Institution
    Illinois Univ., Urbana, IL, USA
  • fYear
    2004
  • fDate
    24-29 Oct. 2004
  • Firstpage
    348
  • Lastpage
    352
  • Abstract
    We present a new lower bound for the error exponents of nested lattice codes for the additive white Gaussian noise (AWGN) channel. The exponents are closely related to those of an unconstrained additive noise channel where the noise is a weighted sum of a white Gaussian and a spherically uniform random vector. The new lower bound improves the previous result derived by Erez and Zamir (2002) and stated in terms of the Poltyrev exponents. More surprisingly, the new lower bound coincides with the random coding error exponents of the optimal Gaussian codes for the AWGN channel in the nonexpurgated regime. One implication of this result is that minimum mean squared error (MMSE) scaling, despite its key role in achieving capacity of the AWGN channel, is no longer fundamental in achieving the best error exponents for rates below channel capacity. These exponents are achieved using a lattice inflation parameter derived from a large-deviation analysis.
  • Keywords
    AWGN channels; channel capacity; channel coding; coding errors; optimisation; AWGN channel; MMSE scaling; Poltyrev exponents; additive white Gaussian noise; channel capacity; error exponents; large-deviation analysis; lattice inflation parameter; lower bound; minimum mean squared error; nested lattice codes; nonexpurgated regime; optimal Gaussian codes; random coding error exponents; spherically uniform random vector; unconstrained additive noise channel; weighted sum; AWGN channels; Additive noise; Additive white noise; Channel capacity; Gaussian distribution; Gaussian noise; Lattices; Maximum likelihood decoding; Noise reduction; Quantization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Workshop, 2004. IEEE
  • Print_ISBN
    0-7803-8720-1
  • Type

    conf

  • DOI
    10.1109/ITW.2004.1405327
  • Filename
    1405327