DocumentCode :
2770920
Title :
STT-MRAM memory cells with enhanced on/off ratio
Author :
Patel, Ravi ; Ipek, Engin ; Friedman, Eby
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY, USA
fYear :
2012
fDate :
12-14 Sept. 2012
Firstpage :
148
Lastpage :
152
Abstract :
Resistive memory technologies are a path to high density, low static power on-chip memories. One such technology, STT-MRAM, exhibits high endurance and is capable of operating as a cache with high write activity. The typically small on/off resistance ratio of the device, however, complicates the sensing process. Two STT-MRAM memory cells are proposed to alleviate this issue. Of the three cells, the diode connected cell increases the resistance ratio by greater than 5x while consuming energy comparable to a standard memory cell during reads.
Keywords :
MRAM devices; cache storage; STT-MRAM memory cells; cache storage; diode connected cell; enhanced on/off ratio; resistive memory technologies; spin torque transfer magnetoresistive RAM; Logic gates; Magnetic tunneling; Random access memory; Resistance; Threshold voltage; Transistors; Tunneling magnetoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOC Conference (SOCC), 2012 IEEE International
Conference_Location :
Niagara Falls, NY
ISSN :
2164-1676
Print_ISBN :
978-1-4673-1294-3
Type :
conf
DOI :
10.1109/SOCC.2012.6398400
Filename :
6398400
Link To Document :
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