Title :
Controlled batch fabrication of crystalline silicon nanobeam-based resonant structures
Author :
Rahafrooz, Amir ; Pourkamali, Siavash
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Denver, Denver, CO, USA
Abstract :
This work presents a self-controlled nano-precision top-down fabrication technique for batch fabrication of single crystalline silicon nanobeams and incorporation of such in electromechanical devices and systems. The fabrication technique takes advantage of the crystalline structure of silicon for the ultimate self-alignment and self-control leading to extremely smooth sidewalls, sharp corners, and controllable feature size reduction. Nanobeams with well uniform width as small as ~250 nm are fabricated on thin SOI substrates utilizing only conventional optical lithography with 2 μm resolution and anisotropic wet etching of silicon. Thermally actuated resonators using such nanobeams as thermal actuators/piezoresistive sensors have been successfully fabricated and characterized.
Keywords :
etching; nanofabrication; photolithography; silicon-on-insulator; anisotropic wet etching; controlled batch fabrication; crystalline silicon nanobeam-based resonant structures; electromechanical devices; optical lithography; piezoresistive sensors; self-controlled nano-precision top-down fabrication technique; size 2 mum; thermal actuators; thermally actuated resonators; thin SOI substrates; Fabrication; Lithography; Nanoscale devices; Nanowires; Optical resonators; Resonant frequency; Silicon;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-9632-7
DOI :
10.1109/MEMSYS.2011.5734683