• DocumentCode
    2772272
  • Title

    Fifth order low-pass transitional Gm-C filter with relaxation oscillator frequency tuning circuit

  • Author

    Teo, T. Hui ; Khoo, E-Sze ; Uday, Dasgupta

  • Author_Institution
    Integrated Circuit & Syst. Lab., Inst. of Microelectron., Singapore, Singapore
  • fYear
    2003
  • fDate
    16-18 Dec. 2003
  • Firstpage
    229
  • Lastpage
    232
  • Abstract
    The design and implementation of gm-C filter with on-chip automatic tuning circuit is described. Transitional Bessel-Chebyshev filter is implemented to compromise between high attenuation and low group-delay variation. The circuit is fabricated with 0.18 μm CMOS process with 6-metal single poly. The filter operates at a cutoff frequency of 10 MHz with a single 1.3 V supply voltage. The measurement results shows an attenuation of 70 dB at stop-band can be achieved, while keeping a low group-delay variation of less than 7 nSec up-to 1.5 times of cutoff frequency. The cutoff frequency can be linearly tuned from 4 MHz to 10 MHz through the tuning loop. By employing relaxation oscillator, accurate and robust frequency tuning scheme is implemented. Measured with sufficient samples, the frequency tuning circuit shows an cutoff frequency tuning error of less than 7.0% over wide range of supply voltages (1.3 V to 2.1 V) and operating temperatures (-40°C to +85°C) in the whole tuning range.
  • Keywords
    Chebyshev filters; circuit tuning; low-pass filters; relaxation oscillators; -40 to 85 degC; 0.18 micron; 1.3 to 2.1 V; 4 to 10 MHz; CMOS process; automatic tuning circuit; fifth order low-pass transitional Gm-C filter; relaxation oscillator frequency tuning circuit; robust frequency tuning; transitional Bessel-Chebyshev filter; Attenuation measurement; CMOS process; Circuit optimization; Cutoff frequency; Frequency measurement; Low pass filters; Oscillators; Robustness; Tuning; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2003 IEEE Conference on
  • Print_ISBN
    0-7803-7749-4
  • Type

    conf

  • DOI
    10.1109/EDSSC.2003.1283520
  • Filename
    1283520