Title :
Interference Cancellation for Single Carrier Frequency Domain Equalizer without Cyclic Prefix
Author :
Lee, Hankil ; Lee, Hankil ; Ahn, Kyungsul ; Park, Hyuncheol
Author_Institution :
Dept. of Inf. & Commun. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
Abstract :
In this paper, we propose a method to mitigate the interferences for single carrier frequency domain equalizer (SC-FDE) without cyclic prefix (CP). SC-FDE systems suffer from the interferences when CP is appended insufficiently. Inter block interference (IBI) is introduced by the previous block, and inter symbols interference (ISI) is also generated by imperfection of the circulant channel matrix. The proposed method can effectively restore the channel matrix to be circulant, but the interference is also increased. Thus, some method, to make a compromise between compensating ISI and increasing the interference, is needed and is that the criterion is adopted to maximize the signal to interference plus noise ratio in this paper. However, the improvement of the performance is limited since the interferences are not removed. To overcome it, the interferences are cancelled using iterative MMSE receiver structures. The performance of the system outperforms that of conventional CP reconstruction method, and it is verified by computer simulations.
Keywords :
equalisers; frequency-domain analysis; interference suppression; intersymbol interference; iterative methods; least mean squares methods; matrix algebra; circulant channel matrix; computer simulations; cyclic prefix; interblock interference; interference cancellation; intersymbols interference; iterative MMSE receiver; signal to interference plus noise ratio; single carrier frequency domain equalizer; Equalizers; Frequency domain analysis; Interference cancellation; Intersymbol interference; Iterative methods; Noise cancellation; OFDM; Reconstruction algorithms; Signal restoration; Signal to noise ratio;
Conference_Titel :
Vehicular Technology Conference (VTC 2010-Spring), 2010 IEEE 71st
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-2518-1
Electronic_ISBN :
1550-2252
DOI :
10.1109/VETECS.2010.5493915