DocumentCode :
2773872
Title :
Calligrapher: a new layout migration engine based on geometric closeness
Author :
Fang, Fang ; Zhu, Jianwen
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
fYear :
2004
fDate :
2004
Firstpage :
25
Lastpage :
30
Abstract :
As the foundries accelerate their update of advanced processes with increasingly complex design rules, the cost of hard intellectual property (IP) development becomes prohibitively high. Automated layout migration techniques used today, which are based on layout compaction developed a decade ago, corrupt advanced design considerations by honoring only design rules. In this paper, we present two new theoretical results: First, we propose a fast constraint generation algorithm proven to be linear, a step forward from the worst case quadratic complexity achieved in the literature. Second, we propose a new optimization metric, called geometric closeness, that can help retain advanced design intention. A layout migration engine based on these two results is implemented and integrated into a comprehensive hard IP development framework, under which the Berkeley low power libraries, originally developed for 1.2μm MOSIS process, are successfully migrated into TSMC 0.25μm and 0.18μm technologies.
Keywords :
circuit complexity; circuit layout CAD; circuit optimisation; integrated circuit layout; system-on-chip; Calligrapher; TSMC technologies; advanced design considerations; advanced design intention; complexity analysis; fast constraint generation algorithm; geometric closeness; hard IP development framework; layout migration engine; optimization metric; systems-on-chip design; Acceleration; Circuits; Compaction; Constraint theory; Costs; Engines; Foundries; Intellectual property; Libraries; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2004. Proceedings. 5th International Symposium on
Print_ISBN :
0-7695-2093-6
Type :
conf
DOI :
10.1109/ISQED.2004.1283645
Filename :
1283645
Link To Document :
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