• DocumentCode
    2774545
  • Title

    Magnification of subwavelength field distributions using a tapered array of wires operating in the canalization regime

  • Author

    Belov, Pavel A. ; Ikonen, Pekka ; Simovski, Constantin R. ; Hao, Yang ; Tretyakov, Sergei A.

  • Author_Institution
    Queen Mary Univ. of London, London
  • fYear
    2008
  • fDate
    5-11 July 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper we have demonstrated simultaneous transmission and magnification of subwavelength field distributions in the microwave regime using a wire medium slab (see Ikonen et al. (2007) for more details). The structure consists of an array of metal wires, and the separation between adjacent wires is radially enlarged. We were able to numerically demonstrate transmission of the near field distribution of a complex-shaped source over a distance corresponding roughly to 3lambda, together with magnification of the distribution by a factor of three. Simulation results showing the operation of the slab at several frequencies deviating from the operational frequency have been presented and analyzed. In addition to the magnification effect the proposed slab could be utilized in the opposite way: electrically large source distributions can be decreased by simply placing the source in front of the larger slab interface. In this case the source distribution is canalized across the slab, and the characteristic dimensions of the distribution are simultaneously decreased by a certain factor.
  • Keywords
    Fabry-Perot resonators; TEM cells; electromagnetic wave propagation; microwave propagation; wires (electric); canalization regime; subwavelength field distributions; tapered wires array; wire medium slab; Crystals; Fabry-Perot; Image analysis; Irrigation; Microwave frequencies; Optical microscopy; Optical surface waves; Resonance; Slabs; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-2041-4
  • Electronic_ISBN
    978-1-4244-2042-1
  • Type

    conf

  • DOI
    10.1109/APS.2008.4619733
  • Filename
    4619733