Title :
Measurements of an EMC test chip for lower EME in CMOS digital circuits
Author :
Zhou, Junfeng ; Dehaene, Wim
Author_Institution :
ESAT-MICAS, Katholieke Univ. Leuven, Heverlee
Abstract :
In digital designs, it becomes more and more important to reduce the supply current variations (di/dt noise) they induce in the supply lines. This is due to the fact that steep variations in supply current give rise to EM (electro-magnetic) emission. Hence, integrated circuits with lower emission are greatly demanded, especially in the automotive market. This paper describes several efficient low EME design techniques. Based on a 0.35 mum CMOS EMC test chip, the effectiveness of emission reduction techniques is quantified through a set of measurements.
Keywords :
CMOS integrated circuits; integrated circuit measurement; integrated circuit testing; CMOS digital circuits; EME; automotive market; electromagnetic emission; emission reduction; size 0.34 mum; steep variations; supply current variations; test chip measurements; Automotive engineering; CMOS digital integrated circuits; Circuit testing; Current supplies; Digital circuits; Electromagnetic compatibility; Integrated circuit measurements; Integrated circuit noise; Noise reduction; Semiconductor device measurement;
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-2737-6
Electronic_ISBN :
978-1-4244-2737-6
DOI :
10.1109/EMCEUROPE.2008.4786893
