Title :
Scaleable equivalent circuit modelling of the E-field coupling to microstrips in the TEM cell
Author :
Vanhee, Filip ; Catrysse, Johan ; Gillon, Renaud ; Gielen, Georges
Author_Institution :
Dept. of Ind. Sci. & Technol., Katholieke Hogeschool Brugge Oostende, Ostend
Abstract :
This investigation focuses on setting up a discrete model of the coupling between a TEM field generated inside a TEM cell to a device under test for use in a circuit simulator. In first instance, different microstrips are used as device under test because of their well-defined characteristics. The resulting models of the TEM cell, the microstrips and the electric field coupling between them are explained. Comparison and validation by measurements is presented for all models.
Keywords :
TEM cells; equivalent circuits; microstrip circuits; E-field coupling; TEM cell; circuit simulator; device under test; microstrips; scaleable equivalent circuit modelling; Capacitance; Circuit simulation; Circuit testing; Coupling circuits; Equivalent circuits; Frequency; IEC standards; Immunity testing; Microstrip; TEM cells; TEM cell; coupling capacitance; microstrips; modelling;
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-2737-6
Electronic_ISBN :
978-1-4244-2737-6
DOI :
10.1109/EMCEUROPE.2008.4786908
