DocumentCode
2776286
Title
Consideration of Mold Compound Cure Shrinkage in Finite Element Modeling
Author
Yean, Chua Li ; Lim, Mayhuan ; Yeo, Alfred ; Lee, Charles
Author_Institution
Infineon Technol. Asia Pacific Pte Ltd., Singapore
fYear
2006
fDate
11-14 Dec. 2006
Firstpage
1
Lastpage
6
Abstract
In this work, the substrate warpage was predicted using the four modeling methods: MeanCTE, InsCTE, CureCTE + MeanCTE and EqvCTE. Both laminate and leadless leadframe substrates were evaluated. The effect of mold compound chemical cure shrinkage on the substrate warpage was also investigated. A laser profilometer was employed to measure the warpage of the laminate and leadless leadframe substrates. Our findings showed that CureCTE + MeanCTE modeling method correlated well with the warpage measurement. This method was employed to further evaluate different mold compounds on the substrate warpage for leadless leadframe substrate. Therefore, the effect of mold compound chemical cure shrinkage is important and has to be implemented appropriately in the model for accurate warpage predictions. It can also be used in package designs and material selections to eliminate the coplanarity issue and achieve an improved assembly process yield in future developments.
Keywords
assembling; electronics packaging; finite element analysis; measurement by laser beam; moulding; surface topography measurement; assembly process yield; coplanarity issue; finite element modeling; laser profilometer; leadless leadframe substrates; material selections; mold compound chemical cure shrinkage; mold compound cure shrinkage; package designs; substrate warpage; warpage measurement; Assembly; Chemical compounds; Electronic packaging thermal management; Electronics packaging; Finite element methods; Laminates; Predictive models; Temperature; Thermal expansion; Thermal loading;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
Conference_Location
Kowloon
Print_ISBN
978-1-4244-0834-4
Electronic_ISBN
978-1-4244-0834-4
Type
conf
DOI
10.1109/EMAP.2006.4430568
Filename
4430568
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