• DocumentCode
    2777974
  • Title

    Automated Preventive Maintenance Of Plasma Etch Systems With The Secs Protocol

  • Author

    Byrne, P.P. ; Youlton, D.S. ; Heiman, K.R. ; Miller, A.

  • Author_Institution
    Brookside Software
  • fYear
    1992
  • fDate
    28-30 Sep 1992
  • Firstpage
    135
  • Lastpage
    137
  • Keywords
    Etching; Fabrication; Job shop scheduling; Plasma applications; Preventive maintenance; Production; Protocols; Semiconductor device manufacture; Software performance; System performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
  • Print_ISBN
    0-7803-0755-0
  • Type

    conf

  • DOI
    10.1109/IEMT.1992.639877
  • Filename
    639877