DocumentCode :
2778813
Title :
SiC junction FETs - a state of the art review
Author :
Mihaila, A.P. ; Udrea, F. ; Rashid, S.J. ; Godignon, P. ; Millan, J.
Author_Institution :
Dept. of Eng., Cambridge Univ.
Volume :
2
fYear :
2005
fDate :
5-5 Oct. 2005
Firstpage :
349
Lastpage :
352
Abstract :
The continuous progress made over the past years in terms of material quality and key technological issues have enabled silicon carbide (SiC) to mature as a material for high power semiconductor industry. These improvements combined with a better understanding of the physics of the devices have placed SiC devices in a position from where they can challenge the present day Silicon (Si) solutions in high power/high temperature applications. Amongst the multitude of SiC switches that have been demonstrated, the Junction Field Effect Transistor (JFET) is the most advanced on and, in fact, already available on the market. This paper reviews the present status of SiC junction-controlled devices and discusses the different approaches one may decide on when considering SiC JFETs for high power, high temperature applications
Keywords :
high-temperature electronics; junction gate field effect transistors; power semiconductor switches; silicon compounds; wide band gap semiconductors; JFETs; SiC; high power semiconductor industry; high power-high temperature applications; junction-controlled devices; silicon carbide junction field effect transistors; silicon carbide switches; Doping; FETs; Hybrid electric vehicles; JFET circuits; MOSFETs; Multichip modules; Silicon carbide; Switched-mode power supply; Switches; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 2005. CAS 2005 Proceedings. 2005 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-9214-0
Type :
conf
DOI :
10.1109/SMICND.2005.1558797
Filename :
1558797
Link To Document :
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