DocumentCode :
2778934
Title :
Accuracy enhancement of the Whispering Gallery mode resonator method using substrates with identical sizes to measure the conductivity and the complex permittivity
Author :
Huong, Tran Thi ; Hirokawa, Jiro ; Kogami, Yoshinori ; Ando, Makoto
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Tokyo
fYear :
2008
fDate :
5-11 July 2008
Firstpage :
1
Lastpage :
4
Abstract :
We have enhanced the WG mode resonator method by using the substrates with the same thickness to evaluate the conductivity and the complex permittivity in the same frequency band. Using the proposed technique we investigate frequency dependencies of PTFE substrate with three types of copper-foils in 55 to 70 GHz band. In the conventional measurements, the conductivity of electrodeposited copper foils is 56% of the value of the international standard annealed copper. However when we used substrates with the same thickness for the measurement the conductivity of electrodeposited copper foil is 35%.
Keywords :
permittivity; resonators; Whispering Gallery mode resonator method; accuracy enhancement; complex permittivity; electrodeposited copper foils; frequency 55 GHz to 70 GHz; international standard annealed copper; Conductivity measurement; Copper; Dielectric measurements; Dielectric substrates; Electromagnetic waveguides; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Size measurement; Whispering gallery modes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2041-4
Electronic_ISBN :
978-1-4244-2042-1
Type :
conf
DOI :
10.1109/APS.2008.4619973
Filename :
4619973
Link To Document :
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