DocumentCode :
2779448
Title :
On the sensitivity of NMR unreliability to non-exponential repair distributions
Author :
Kieckhafer, R.M. ; Azadmanesh, M.H. ; Hui, Y.
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan Technol. Univ., Houghton, MI, USA
fYear :
2000
fDate :
2000
Firstpage :
293
Lastpage :
300
Abstract :
The failure and repair of modules in an N-modular redundant (NMR) system are governed by a failure time distribution and a repair time distribution, respectively. It is generally reasonable to assume that a module´s failure time distribution is a simple exponential distribution. However, it is not reasonable to assume that the repair time distribution is also exponential. Reliability models with non-exponential repair have a higher computational complexity than a model of the same system with an exponential repair time distribution. This paper presents the results of a systematic study to determine whether non-exponential repair distributions produce significant differences in calculated NMR system unreliability, relative to an exponential repair distribution with the same mean time to repair (MTTR). Our approach is to embed Erlang repair distributions in generalized stochastic Petri net (GSPN) models of NMR systems and evaluate the unreliability. Our results show that, for a wide range of system parameters, the choice of a repair time distribution has minimal impact on the calculated unreliability. Rather, it is the MTTR that is the dominant parameter affecting unreliability
Keywords :
Petri nets; computational complexity; exponential distribution; redundancy; sensitivity; software maintenance; software reliability; stochastic processes; subroutines; Erlang repair distributions; N-modular redundant system unreliability; computational complexity; exponential distribution; failure time distribution; generalized stochastic Petri net models; mean time to repair; module failure; module repair; nonexponential distribution; reliability models; repair time distribution; sensitivity; system parameters; Computational complexity; Exponential distribution; Information science; NASA; Nuclear magnetic resonance; Petri nets; Power system modeling; Stochastic processes; Stochastic systems; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Assurance Systems Engineering, 2000, Fifth IEEE International Symposim on. HASE 2000
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7695-0927-4
Type :
conf
DOI :
10.1109/HASE.2000.895474
Filename :
895474
Link To Document :
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