DocumentCode :
2779594
Title :
Divide And Merge Image Processing For Pattern Defect Analysis Of Printed Circuit Boards
Author :
Ito, Masayasu ; Nikaido, Yosuhiro ; Hoshino, Michinori
Author_Institution :
Tokyo University of Agriculture and Technology
fYear :
1992
fDate :
28-30 Sep 1992
Firstpage :
178
Lastpage :
182
Keywords :
Circuit analysis; Conductors; Image analysis; Image processing; Inspection; Insulation; Optical sensors; Pattern analysis; Printed circuits; Skeleton;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
Print_ISBN :
0-7803-0755-0
Type :
conf
DOI :
10.1109/IEMT.1992.639886
Filename :
639886
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2779594
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