Title :
Nonredundant error correction for π/4-QPSK in mobile satellite channels
Author :
Yang, Jiashi ; Feher, Kamilo
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Davis, CA, USA
Abstract :
An improved π/4-QPSK (quadrature phase shift keying) receiver which incorporates a simple nonredundant error correction (NEC) structure is proposed for satellite and land-mobile digital broadcasting. The bit error rate (BER) performance of the π/4-QPSK with NEC is analyzed and evaluated in fast Rician fading and an additive white Gaussian noise (AWGN) environment using computer simulation. It is demonstrated that with simple electronics one can improve the performance of a noncoherently detected π/4-QPSK signal in both AWGN and fast Rician fading. When the K-factor (defined as the ratio of the average power of the multipath signal to direct path power) of the Rician channel decreases, the improvement increases. An improvement of 1.2 dB could be obtained at a BER of 10-4 in an AWGN channel. Three types of noncoherent detection schemes for π/4-QPSK with a NEC structure are discussed: IF (intermediate frequency) band differential detection; baseband differential detection; and FM discriminator
Keywords :
digital radio systems; error correction; mobile radio systems; phase shift keying; satellite relay systems; π/4-QPSK receiver; AWGN; BER; FM discriminator; K-factor; additive white Gaussian noise; average power; baseband differential detection; bit error rate; digital broadcasting; direct path power; fast Rician fading; intermediate frequency; land mobile radio; multipath signal; noncoherently detected π/4-QPSK; nonredundant error correction; quadrature phase shift keying; satellite mobile radio; AWGN; Additive white noise; Bit error rate; Computer simulation; Error correction; National electric code; Performance analysis; Quadrature phase shift keying; Rician channels; Satellite broadcasting;
Conference_Titel :
Vehicular Technology Conference, 1991. Gateway to the Future Technology in Motion., 41st IEEE
Conference_Location :
St. Louis, MO
Print_ISBN :
0-87942-582-2
DOI :
10.1109/VETEC.1991.140601