Title :
A Puncturing Scheme for Low-Density Parity-Check Codes Based on 1-SR Nodes
Author :
Zhang, Lijun ; Ma, Fuli ; Cheng, L.L.
Author_Institution :
Sch. of Electr. & Inform. Eng., Beijing Jiaotong Univ., Beijing, China
Abstract :
A rate-compatible puncturing scheme for LDPC codes is proposed based on the fact that a one-step recoverable (1-SR) node is more reliable than a k-SR node (k>;1) and a 1-SR node with more survived check nodes can be recovered more reliably in a recovery tree, so the scheme tries to obtain 1-SR nodes which have multiple survived check nodes as many as possible. Simulation results show that the puncturing scheme has better performance than both the random puncturing scheme and the novel method in [5].
Keywords :
parity check codes; random processes; telecommunication network reliability; trees (mathematics); 1-SR nodes; LDPC codes; k-SR node; low-density parity-check codes; multiple survived check nodes; one-step recoverable (node; random puncturing scheme; rate-compatible puncturing scheme; recovery tree; Algorithm design and analysis; Bit error rate; Electronic mail; Encoding; Indexes; Parity check codes; Reliability;
Conference_Titel :
Vehicular Technology Conference (VTC Fall), 2012 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4673-1880-8
Electronic_ISBN :
1090-3038
DOI :
10.1109/VTCFall.2012.6398903
