Title :
Microwave performance of heterojunction vertical dual carrier field effect transistors and integrated circuits
Author :
Huang, C. ; Yang, Y.H. ; Li, G.H. ; Huang, D.H. ; Han, D.J.
Author_Institution :
Aerosp, Beijing, China
Abstract :
Since heterojunction transistors have been invented, devices of various materials have been developed with excellent performance such as AlGaAs-GaAs, Si-GeSi, etc. Here, we report a new mode of operation of heterojunction transistors and call it the Heterojunction Vertical Dual Carrier Field Effect Transistor (HVDCFET). The HVDCFET and its integrated circuit form HVDCFEIC have the advantage of field effect transistor operation. The mobility μ is q/kT times greater than the diffusion constant D. With the same injection at the source or emitter junction, the drift current will be q/kT times larger than the diffusion current, resulting in a larger drain current by a factor of q/kT for HVDCFET than the collector current for a HBT. HVDCFET and HVDCFEIC have low operation voltage in the range of one volt while the HBT operates at higher voltages. We can also fabricate complementary HVDCFEIC for switching, microwave, analog or SOC systems. The most important advantage of HVDCFET or HVDCFEIC is that we can use the molecular beam epitaxial process to fabricate grown channel lengths of 20 nm and effective channel lengths of 5 to 10 nm
Keywords :
field effect MMIC; microwave field effect transistors; molecular beam epitaxial growth; FET integrated circuits; HVDCFET ICs; LV operation; MBE growth; diffusion constant; drain current; drift current; field effect transistor operation; heterojunction vertical dual carrier FET; low operation voltage; microwave performance; mobility; molecular beam epitaxial process; FET integrated circuits; Heterojunction bipolar transistors; Integrated circuit technology; Microwave FET integrated circuits; Microwave FETs; Microwave integrated circuits; Physics; Semiconductor diodes; Space charge; Voltage;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2000, 2nd International Conference on. ICMMT 2000
Conference_Location :
Beijing
Print_ISBN :
0-7803-5743-4
DOI :
10.1109/ICMMT.2000.895603