Title :
Cryogenic Reliability Impact on Analog Circuits at Extreme Low Temperatures
Author :
Chen, Yuan ; Westergard, Lynett ; Billman, Curtis ; Leon, Rosa ; Tuan Vo ; White, Mark ; Mojarradi, Mohammad ; Kolawa, Elizabeth
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
Cryogenic temperatures have a greater impact on analog circuit reliability than on digital circuit reliability. Analog gain tolerance may provide a more relaxed criterion while the offset voltage criterion has more bias dependence. For a pre-determined analog circuit offset failure criterion and circuit operating temperature profile, either design rules can be generated for the balanced and unbalanced matching transistor pairs in the circuit for certain hot carrier aging life requirement, or the hot carrier aging life time can be estimated for a certain unbalanced matching transistor pairs/chains
Keywords :
analogue circuits; cryogenic electronics; hot carriers; reliability; transistors; analog circuit reliability; analog gain tolerance; cryogenic reliability impact; extreme low temperatures; failure criterion; hot carrier aging; low temperature electronics; matching transistor; Aging; Analog circuits; CMOS technology; Cryogenics; Degradation; Digital circuits; Hot carriers; Semiconductor device reliability; Temperature; Voltage; Low temperature electronics; analog circuit reliability; hot carrier aging;
Conference_Titel :
Reliability physics symposium, 2007. proceedings. 45th annual. ieee international
Conference_Location :
Phoenix, AZ
Print_ISBN :
1-4244-0919-5
Electronic_ISBN :
1-4244-0919-5
DOI :
10.1109/RELPHY.2007.369885
