DocumentCode
2783013
Title
Statistical analysis of cycle times in a complex microelectronics manufacturing line
Author
Barkany, Silvia ; Fromm, Hansjörg ; Gihr, Ottmar ; Solf, Bernhard
Author_Institution
IBM German Manufacturing Technology Center (GMTC)
fYear
1992
fDate
1992
Firstpage
18
Lastpage
25
Keywords
Costs; Databases; Electronics industry; Manufacturing industries; Microelectronics; Monitoring; Production systems; Pulp manufacturing; Statistical analysis; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium, 1992. IEMT 1992. 12th International
Print_ISBN
0-7803-0629-5
Type
conf
DOI
10.1109/IEMT.1992.763393
Filename
763393
Link To Document