Title :
Special considerations for the implementation of statistical process control (SPC) for surface mount technology (SMT)
Author :
Anjard, R.P., Sr. ; Shaffer, D. ; Sumner, W. ; Wheeler, S. ; Adzima, J.
Author_Institution :
General Dynamics Electronics
Keywords :
Computer aided manufacturing; Continuous improvement; Costs; Electronics industry; Lead; Manufacturing processes; Process control; Storage area networks; Strontium; Surface-mount technology;
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1992. IEMT 1992. 12th International
Print_ISBN :
0-7803-0629-5
DOI :
10.1109/IEMT.1992.763396
