Deterministic pattern testability analysis

Existing testability measures suffer from a number of deficiencies, particularly when they are used in conjunction with deterministic test pattern generators. The values obtained may not be suitable for use as guidance heuristics, design hierarchy is often ignored, and results with sequential circuits are often poor. Little is known of the relative quality of test measures when used with deterministic generators as studies have concentrated on random patterns. This paper discusses the deficiencies of existing testability measures with reference to deterministic pattern generation and sequential circuits and suggests some approaches, currently being investigated at the University of Hull, which may provide better results