Title :
IEE Colloquium on `Wafer Scale Integration´ (Digest No.111)
Abstract :
The following topics were dealt with: technology; parallel computing; high power devices; parallel machines; yield optimisation; CMOS ICs; experimental programmes
Keywords :
VLSI; integrated circuit technology; monolithic integrated circuits; semiconductor device models; CMOS ICs; IC technology; VLSI; WSI; high power devices; parallel computing; parallel machines; yield optimisation;
Conference_Titel :
Wafer Scale Integration, IEE Colloquium on
Conference_Location :
London
