DocumentCode :
2784449
Title :
High-field conduction and breakdown strength in poly-p-xylylene thin film
Author :
Mori, Tatuo ; Takai, Yoshiaki ; Mizutani, Teruyoshi ; Ieda, Masayuki
Author_Institution :
Nagoya University
fYear :
1988
fDate :
1988
Firstpage :
231
Lastpage :
234
Keywords :
Breakdown voltage; Dielectric losses; Dielectric thin films; Electric breakdown; Ionization; Plasma measurements; Plasma temperature; Polymer films; Temperature dependence; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulating Materials, 1988. Proceedings of the Twenty-First Symposium on
Print_ISBN :
4-88686-041-9
Type :
conf
DOI :
10.1109/ISEIM.1988.763481
Filename :
763481
Link To Document :
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